- Sampling Rate (Per Second)：
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- Data Interface：
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- Utilized IC / Part：
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- DAC Type：
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- Condizioni selezionate:
Scopri i prodotti 31
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immagine | Numero di parte | fabbricante | quantità | Periodo di consegna | Prezzo unitario | acquistare | descrizione | Sampling Rate (Per Second) | Data Interface | Number of Bits | Utilized IC / Part | Number of DAC's | DAC Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
immagine | Numero di parte | fabbricante | quantità | Periodo di consegna | Prezzo unitario | acquistare | descrizione | Sampling Rate (Per Second) | Data Interface | Number of Bits | Utilized IC / Part | Number of DAC's | DAC Type | |
|
Linear Technology/Analog Devices |
3
|
3 giorni |
-
|
MOQ: 1 MPQ: 1
|
EVAL BOARD FOR LT1812 LTC1668
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50M | Parallel | 16 | LT1812，LTC1668 | 1 | Current | |||
|
|
Texas Instruments |
5
|
3 giorni |
-
|
MOQ: 1 MPQ: 1
|
EVAL MODULE FOR DAC5672
|
275M | Parallel | 14 | DAC5672 | 2 | Current | |||
|
|
Linear Technology/Analog Devices |
2
|
3 giorni |
-
|
MOQ: 1 MPQ: 1
|
BOARD EVAL LTC1668
|
50M | Parallel | 16 | LTC1668 | 1 | Current | |||
|
|
Texas Instruments |
3
|
3 giorni |
-
|
MOQ: 1 MPQ: 1
|
EVALUATION MODULE FOR DAC5652
|
275M | Parallel | 10 | DAC5652 | 2 | Current | |||
|
|
Texas Instruments |
3
|
3 giorni |
-
|
MOQ: 1 MPQ: 1
|
EVAL MODULE FOR DAC5675
|
400M | Parallel | 14 | DAC5675A | 1 | Current | |||
|
|
Linear Technology/Analog Devices |
3
|
3 giorni |
-
|
MOQ: 1 MPQ: 1
|
EVAL BOARD FOR LT6600 LTC1668
|
50M | Parallel | 16 | LT6600，LTC1668 | 1 | Current | |||
|
|
Linear Technology/Analog Devices |
2
|
3 giorni |
-
|
MOQ: 1 MPQ: 1
|
EVAL BOARD FOR LT1468 LTC1668
|
50M | Parallel | 16 | LT1468，LTC1668 | 1 | Current | |||
|
|
Texas Instruments |
1
|
3 giorni |
-
|
MOQ: 1 MPQ: 1
|
EVAL MODULE FOR DAC5662
|
275M | Parallel | 12 | DAC5662 | 2 | Current | |||
|
|
NXP USA Inc. |
1
|
3 giorni |
-
|
MOQ: 1 MPQ: 1
|
BOARD DEMO DAC1408D650
|
650M | Serial JESD204A，SPI? | 14 | DAC1408D650 | 2 | Current | |||
|
|
Texas Instruments |
inchiesta
|
- |
-
|
MOQ: 1 MPQ: 1
|
EVAL MODULE FOR DAC2932
|
40M | Serial，Parallel | 12 | DAC2932 | 6 | Current/Voltage | |||
|
|
NXP USA Inc. |
inchiesta
|
- |
-
|
MOQ: 1 MPQ: 1
|
BOARD DEMO FOR DAC1405D750
|
750M | Serial JESD204A，SPI? | 14 | DAC1405D750 | 2 | Current | |||
|
|
|
Intersil |
inchiesta
|
- |
-
|
MOQ: 1 MPQ: 1
|
EVALUATION PLATFORM SOIC HI5731
|
100M | Parallel | 12 | HI5731 | 1 | Current | ||
|
|
|
Intersil |
inchiesta
|
- |
-
|
MOQ: 1 MPQ: 1
|
EVALUATION PLATFORM HI5741
|
100M | Parallel | 14 | HI5741 | 1 | Current | ||
|
|
IDT，Integrated Device Technology Inc |
inchiesta
|
- |
-
|
MOQ: 1 MPQ: 1
|
BOARD DEMO FOR DAC1405D650
|
650M | Parallel | 14 | DAC1405D650 | 2 | Current | |||
|
|
IDT，Integrated Device Technology Inc |
inchiesta
|
- |
-
|
MOQ: 1 MPQ: 1
|
BOARD DEMO FOR DAC1617D1G0
|
1G | LVDS - Serial，SPI | 16 | DAC1617D1G0 | 2 | Current | |||
|
|
IDT，Integrated Device Technology Inc |
inchiesta
|
- |
-
|
MOQ: 1 MPQ: 1
|
BOARD DEMO 16BIT DUAL DAC
|
1.5G | Serial JESD204B，SPI? | 16 | DAC1658D1G5 | 2 | Current | |||
|
|
IDT，Integrated Device Technology Inc |
inchiesta
|
- |
-
|
MOQ: 1 MPQ: 1
|
BOARD DEMO FOR DAC1617D1G0IQM
|
1G | LVDS - Serial，SPI | 16 | DAC1617D1G0 | 2 | Current | |||
|
|
IDT，Integrated Device Technology Inc |
inchiesta
|
- |
-
|
MOQ: 1 MPQ: 1
|
BOARD DEMO FOR DAC1627D1G25IQM
|
1.25G | LVDS - Serial，SPI | 16 | DAC1627D1G25 | 2 | Current | |||
|
|
IDT，Integrated Device Technology Inc |
inchiesta
|
- |
-
|
MOQ: 1 MPQ: 1
|
BOARD DEMO FOR DAC1653Q1G5
|
1.5G | Serial JESD204B，SPI? | 16 | DAC1653Q1G5 | 4 | Current | |||
|
|
IDT，Integrated Device Technology Inc |
inchiesta
|
- |
-
|
MOQ: 1 MPQ: 1
|
BOARD DEMO FOR DAC1658D1G25IQM
|
1.25G | Serial JESD204B，SPI? | 16 | DAC1658D1G25 | 2 | Current |
