CIRCUITO INTEGRATO - Zui Ai Technology（Taiwan）Company.

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immagine	Numero di parte	fabbricante	quantità	Periodo di consegna	Prezzo unitario	acquistare	descrizione	Series	Type	Contact Material	Number of Positions or Pins (Grid)
immagine	Numero di parte	fabbricante	quantità	Periodo di consegna	Prezzo unitario	acquistare	descrizione	Series	Type	Contact Material	Number of Positions or Pins (Grid)
	5108	Pomona Electronics	inchiesta	-	-	DIP TEST CLIP 8PIN CLOSED GOLD MOQ: 1 MPQ: 1	DIP TEST CLIP 8PIN CLOSED GOLD	DIP Clip	DIP，Standard	Beryllium Copper	8 (2 x 4)
	5116	Pomona Electronics	inchiesta	-	-	DIP TEST CLIP 16PIN CLOSED GOLD MOQ: 1 MPQ: 1	DIP TEST CLIP 16PIN CLOSED GOLD	DIP Clip	DIP，Standard	Beryllium Copper	16 (2 x 8)
	5120	Pomona Electronics	inchiesta	-	-	DIP TEST CLIP 20PIN CLOSED GOLD MOQ: 1 MPQ: 1	DIP TEST CLIP 20PIN CLOSED GOLD	DIP Clip	DIP，Standard	Beryllium Copper	20 (2 x 10)
	5124/POM	Pomona Electronics	inchiesta	-	-	DIP TEST CLIP 24PIN CLOSED GOLD MOQ: 1 MPQ: 1	DIP TEST CLIP 24PIN CLOSED GOLD	DIP Clip	DIP，Standard	Beryllium Copper	24 (2 x 12)
	5208	Pomona Electronics	inchiesta	-	-	DIP TEST CLIP 8PIN OPEN GOLD MOQ: 1 MPQ: 1	DIP TEST CLIP 8PIN OPEN GOLD	DIP Clip	DIP，Open Back	Beryllium Copper	8 (2 x 4)
	5216	Pomona Electronics	inchiesta	-	-	DIP TEST CLIP 16PIN OPEN GOLD MOQ: 1 MPQ: 1	DIP TEST CLIP 16PIN OPEN GOLD	DIP Clip	DIP，Open Back	Beryllium Copper	16 (2 x 8)
	5314	Pomona Electronics	inchiesta	-	-	DIP TEST CLIP 14PIN OPEN GOLD MOQ: 1 MPQ: 1	DIP TEST CLIP 14PIN OPEN GOLD	DIP Clip	DIP，Open Back	Beryllium Copper	14 (2 x 7)
	5413	Pomona Electronics	inchiesta	-	-	TEST CLIP 14PIN SOIC MOQ: 1 MPQ: 1	TEST CLIP 14PIN SOIC	SOIC Clip	SOIC，0.15 to 0.35" Wide	-	14 (2 x 7)
	5643	Pomona Electronics	inchiesta	-	-	TEST CLIP 100PIN QFP .65MM PITCH MOQ: 1 MPQ: 1	TEST CLIP 100PIN QFP .65MM PITCH	EIAJ	QFP，0.65mm Pitch	-	100 (2 x 20，2 x 30)
	5643L	Pomona Electronics	inchiesta	-	-	CLIP 100PIN 16.3X22.3MM QFP MOQ: 1 MPQ: 1	CLIP 100PIN 16.3X22.3MM QFP	EIAJ	QFP，0.65mm Pitch	-	100 (2 x 20，2 x 30)
	5643L-2	Pomona Electronics	inchiesta	-	-	CLIP 100PIN 15.6X21.6MM QFP MOQ: 1 MPQ: 1	CLIP 100PIN 15.6X21.6MM QFP	EIAJ	QFP，0.65mm Pitch	-	100 (2 x 20，2 x 30)
	5645	Pomona Electronics	inchiesta	-	-	TEST CLIP 160PIN QFP .65MM PITCH MOQ: 1 MPQ: 1	TEST CLIP 160PIN QFP .65MM PITCH	EIAJ	QFP，0.65mm Pitch	-	160 (4 x 40)
	5645L	Pomona Electronics	inchiesta	-	-	TEST CLIP 160PIN QFP .65MM PITCH MOQ: 1 MPQ: 1	TEST CLIP 160PIN QFP .65MM PITCH	EIAJ	QFP，0.65mm Pitch	-	160 (4 x 40)
	5645L-2	Pomona Electronics	inchiesta	-	-	TEST CLIP 160PIN QFP .65MM PITCH MOQ: 1 MPQ: 1	TEST CLIP 160PIN QFP .65MM PITCH	EIAJ	QFP，0.65mm Pitch	-	160 (4 x 40)
	5713/POM	Pomona Electronics	inchiesta	-	-	TEST CLIP 100PIN JEDEC MOQ: 1 MPQ: 1	TEST CLIP 100PIN JEDEC	JEDEC	QFP，0.65mm Pitch	-	160 (4 x 40)
	5751L	Pomona Electronics	inchiesta	-	-	CLIP TEST 80PIN QFP LOCK ON MOQ: 1 MPQ: 1	CLIP TEST 80PIN QFP LOCK ON	EIAJ	QFP，0.80mm Pitch	-	80 (2 x 16，2 x 24)
	5751L-2	Pomona Electronics	inchiesta	-	-	CLIP TEST 80PIN QFP PRESS ON MOQ: 1 MPQ: 1	CLIP TEST 80PIN QFP PRESS ON	EIAJ	QFP，0.80mm Pitch	-	80 (2 x 16，2 x 24)
	5770	Pomona Electronics	inchiesta	-	-	CLIP TEST 208PIN QFP .50MM PITCH MOQ: 1 MPQ: 1	CLIP TEST 208PIN QFP .50MM PITCH	EIAJ	QFP，0.50mm Pitch	-	208 (4 x 52)
	5770L	Pomona Electronics	inchiesta	-	-	CLIP TEST 208PIN QFP LOCK ON MOQ: 1 MPQ: 1	CLIP TEST 208PIN QFP LOCK ON	EIAJ	QFP，0.50mm Pitch	-	208 (4 x 52)
	5772-2	Pomona Electronics	inchiesta	-	-	TEST CLIP EIAJ QFP 128POS 3.2 MOQ: 1 MPQ: 1	TEST CLIP EIAJ QFP 128POS 3.2	EIAJ	QFP，0.65mm Pitch	-	128 (4 x 32)