Scopri i prodotti 4
immagine Numero di parte fabbricante quantità Periodo di consegna Prezzo unitario acquistare descrizione Voltage - Max Attenuation Value Bandwidth Resistance - Input
CT4076-EU
Cal Test Electronics
inchiesta
-
-
MOQ: 1  MPQ: 1
DIFFERENTIAL PROBE KIT 35MHZ 15K
7500V (7.5kV) (DC + AC Peak) 100:1,1000:1 35MHz 50M
CT4076-NA
Cal Test Electronics
inchiesta
-
-
MOQ: 1  MPQ: 1
DIFFERENTIAL PROBE KIT 35MHZ 15K
7500V (7.5kV) (DC + AC Peak) 100:1,1000:1 35MHz 50M
CT4079-EU
Cal Test Electronics
inchiesta
-
-
MOQ: 1  MPQ: 1
DIFFERENTIAL PROBE KIT 50 MHZ 30
15000V (15kV) (DC + AC Peak) 200:1,2000:1 50MHz 40M
CT4079-NA
Cal Test Electronics
inchiesta
-
-
MOQ: 1  MPQ: 1
DIFFERENTIAL PROBE KIT 50MHZ 3 K
15000V (15kV) (DC + AC Peak) 200:1,2000:1 50MHz 40M